Dual-axis scanning system and method

Image analysis – Applications – 3-d or stereo imaging analysis

Reexamination Certificate

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Details

C345S419000, C348S042000, C356S012000, C359S462000

Reexamination Certificate

active

07634129

ABSTRACT:
An image acquisition system and method may employ a non-orthogonal optical axis. The optical axis may be established in such a manner as to position a focal plane of an imaging device in a selected orientation relative to the object space. Such selective positioning and orientation of the focal plane allows the integration of two coordinate axes and enables dual-axis scanning of the object space. In some embodiments, the focal plane may extend throughout the entire depth dimension of the object space.

REFERENCES:
patent: 4689491 (1987-08-01), Lindow et al.
patent: 5114226 (1992-05-01), Goodwin et al.
patent: 5326659 (1994-07-01), Liu et al.
patent: 5463667 (1995-10-01), Ichinose et al.
patent: 5528194 (1996-06-01), Ohtani
patent: 5543832 (1996-08-01), Oravecz et al.
patent: 5736725 (1998-04-01), Danielson
patent: 5835241 (1998-11-01), Saund
patent: 6020917 (2000-02-01), Oravecz et al.
patent: 6023289 (2000-02-01), Oravecz et al.
patent: 6222937 (2001-04-01), Cohen et al.
patent: 6307674 (2001-10-01), Sauer et al.
patent: 6351573 (2002-02-01), Schneider
patent: 6393141 (2002-05-01), Cronshaw et al.
patent: 6518570 (2003-02-01), Hough
patent: 6603580 (2003-08-01), Taillie
patent: 6834238 (2004-12-01), Hochman
patent: 6885479 (2005-04-01), Pilu
patent: 6940664 (2005-09-01), Pilu
patent: 2002/0031249 (2002-03-01), Komuro et al.
patent: 2002/0051006 (2002-05-01), Katagiri et al.
patent: 2002/0181762 (2002-12-01), Silber
patent: 2003/0068079 (2003-04-01), Park
patent: 2003/0081717 (2003-05-01), Eppler et al.
patent: 2003/0103277 (2003-06-01), Mohwinkel
patent: 2005/0199598 (2005-09-01), Hunter et al.

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