Dual axis inclination measuring apparatus and method

Details Dual axis inclination measuring apparatus and method Dual axis inclination measuring apparatus and method

1982-05-24

1984-12-04

Zache, Raulfe B.

Boots, shoes, and leggings

33366, 73 1E, G01C 906

Patent

active

044868448

ABSTRACT:
A dual axis inclination measuring system includes a sensor unit for placement on a surface to determine the inclination of the surface with respect to two mutually perpendicular horizontal axes and an indicator unit connected to the sensor unit and operative to process signals generated by the sensor unit to determine and indicate the inclination of the test surface. The sensor unit includes a dual axis sensor element which cooperates with circuits for generating signals having voltage levels proportional to the inclination of the sensor. The indicator unit includes an analog-to-digital converter operative to convert the voltage levels to digital words and a digital computer operative to calculate angle readings from the digital words. The computer includes a look-up table of a plurality of the digital words stored in a memory of the computer and is calibrated exclusively to the particular sensor with which the computer is used, thereby providing great accuracy.

REFERENCES:
patent: 2592941 (1952-04-01), Moore
patent: 2711490 (1955-06-01), Wilcox
patent: 2936411 (1960-05-01), Doty
patent: 3009255 (1961-11-01), Robillard
patent: 3059343 (1962-10-01), Kermode
patent: 3286357 (1966-11-01), Grumman
patent: 3421227 (1969-01-01), Turner et al.
patent: 3483266 (1969-04-01), Carow et al.
patent: 3486238 (1969-12-01), Hansen
patent: 3496565 (1970-02-01), Jenkins
patent: 3576124 (1971-04-01), O'Connor
patent: 3633003 (1972-01-01), Talwani
patent: 3823486 (1974-07-01), Bhat
patent: 3911592 (1975-10-01), Crask
patent: 4022284 (1977-05-01), Crow
patent: 4028815 (1977-06-01), Buckley et al.
patent: 4077132 (1978-03-01), Erickson
patent: 4085375 (1978-04-01), Galuschak
patent: 4094073 (1978-06-01), Parra
patent: 4167818 (1979-09-01), Cantarella et al.
Computer System Architecture M. Mano; Prentice Hall Englewood Cliffs, N.J. 07632, 1982, pp. 110-112, 129-130.
The Bugbook I Peter Rony et al., E&L Instruments Derby Conn. 06418, 1974, 5-33-35.

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