Dual axis fluorescence microscope with modulated input

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation

Reexamination Certificate

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C250S458100

Reexamination Certificate

active

07130042

ABSTRACT:
A dual beam confocal microscope is provided. An optical source assembly provides two mutually coherent optical beams differing in frequency by a frequency difference Δf. The two beams are received by focusing assemblies that provide two focused beams to a sample. The focused beams intersect at a beam intersection angle within a target region of the sample. The two focused beams have respective focal regions preferably overlapping with the target region. A detector receives radiation emitted from the sample, including radiation emitted from the target region. The detector output, responsive to received intensity, is filtered with an electrical filter to provide a filtered signal. The electrical filter has a frequency response H(f), where H(f) has a pass band including f=Δf and a stop band including f=0. Optionally, an optical filter and/or a collection assembly can be placed between the sample and detector.

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