Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-04-12
2005-04-12
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S067000, C702S070000, C702S071000, C702S073000
Reexamination Certificate
active
06879919
ABSTRACT:
Peak capture circuitry for measuring a peak value of a waveform characterized by a first portion having a first rate of change and a second portion having a relatively faster rate of change. Peak stretching circuitry stretches a portion of the waveform as a function of time. Digital signal processing circuitry samples an output waveform of the peak stretching circuitry for determining the peak value. Thus, despite any steeply sloped portion, samples can be reliably taken throughout the waveform for calculation of peak value.
REFERENCES:
patent: 3979670 (1976-09-01), Vahaviolos
patent: 6429546 (2002-08-01), Ropp et al.
patent: 6606346 (2003-08-01), Abraham et al.
patent: 20030146871 (2003-08-01), Karr et al.
Loewe Thomas D.
Panko James A.
Ruther Timothy G.
Taraki Yosuf M.
Hoff Marc S.
McDermott Will & Emery LLP
Snap-On Incorporated
Suarez Felix
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