DSP assisted peak capture circuit and method

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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C702S067000, C702S070000, C702S071000, C702S073000

Reexamination Certificate

active

06879919

ABSTRACT:
Peak capture circuitry for measuring a peak value of a waveform characterized by a first portion having a first rate of change and a second portion having a relatively faster rate of change. Peak stretching circuitry stretches a portion of the waveform as a function of time. Digital signal processing circuitry samples an output waveform of the peak stretching circuitry for determining the peak value. Thus, despite any steeply sloped portion, samples can be reliably taken throughout the waveform for calculation of peak value.

REFERENCES:
patent: 3979670 (1976-09-01), Vahaviolos
patent: 6429546 (2002-08-01), Ropp et al.
patent: 6606346 (2003-08-01), Abraham et al.
patent: 20030146871 (2003-08-01), Karr et al.

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