Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2008-07-22
2008-07-22
Chen, Kin-Chan (Department: 1792)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S714000, C216S067000
Reexamination Certificate
active
11545528
ABSTRACT:
When etching is performed with respect to a silicon-containing material by using a dry etching apparatus having a dual power source, the application of bias power is initiated before oxidization proceeds at a surface of the silicon-containing material. Specifically, the application of the bias power is initiated before the application of source power is initiated. Alternatively, the source power and the bias power are applied such that the effective value of the source power reaches a second predetermined value after the effective value of the bias power reaches a first predetermined value.
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Niko Hideo
Yamaguchi Takao
Yamashita Takeshi
Chen Kin-Chan
Costellia Jeffrey L.
Matsushita Electric - Industrial Co., Ltd.
Nixon & Peabody LLP
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