Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2006-12-12
2006-12-12
Chen, Kin-Chan (Department: 1765)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S719000, C216S063000
Reexamination Certificate
active
07148151
ABSTRACT:
When etching is performed with respect to a silicon-containing material by using a dry etching apparatus having a dual power source, the application of bias power is initiated before oxidization proceeds at a surface of the silicon-containing material. Specifically, the application of the bias power is initiated before the application of source power is initiated. Alternatively, the source power and the bias power are applied such that the effective value of the source power reaches a second predetermined value after the effective value of the bias power reaches a first predetermined value.
REFERENCES:
patent: 5872063 (1999-02-01), Chao et al.
patent: 5877032 (1999-03-01), Guinn et al.
patent: 5981355 (1999-11-01), Lee
patent: 6060371 (2000-05-01), Shinmura
patent: 6103603 (2000-08-01), Han
patent: 6124212 (2000-09-01), Fan et al.
patent: 6168726 (2001-01-01), Li et al.
patent: 6180533 (2001-01-01), Jain et al.
patent: 6261921 (2001-07-01), Yen et al.
patent: 6337273 (2002-01-01), Kang
patent: 6402974 (2002-06-01), Trevor et al.
patent: 6426477 (2002-07-01), Koshimizu et al.
patent: 6432834 (2002-08-01), Kim
patent: 6515328 (2003-02-01), Yang et al.
patent: 6521539 (2003-02-01), Zhou et al.
patent: 6635185 (2003-10-01), Demmin et al.
patent: 6790374 (2004-09-01), Ho et al.
patent: 01-106432 (1989-04-01), None
patent: 03-280536 (1991-12-01), None
patent: 08-288256 (1995-11-01), None
patent: 09-082495 (1997-03-01), None
patent: 11-145111 (1999-05-01), None
patent: 11-238722 (1999-08-01), None
patent: 11-251292 (1999-09-01), None
Niko Hideo
Yamaguchi Takao
Yamashita Takeshi
Chen Kin-Chan
Nixon & Peabody LLP
Studebaker Donald R.
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