Measuring and testing – Testing by impact or shock – Accelerated or decelerated specimen
Reexamination Certificate
2007-10-02
2007-10-02
Williams, Hezron (Department: 2856)
Measuring and testing
Testing by impact or shock
Accelerated or decelerated specimen
Reexamination Certificate
active
11170333
ABSTRACT:
The drop impact measuring system has i) a plurality of bimorph-type acceleration sensor containing a plurality of free vibrating sections each of which has individual draw-out electrodes; ii) a switch section for selecting output from the bimorph-type acceleration sensors; iii) an amplifying circuit for amplifying a signal applied via the switch section from the acceleration sensors; and iv) a logic circuit for logically evaluating the output from the amplifying circuit and controlling the switch section according to the result acquired from the logical evaluation.
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International Search Report corresponding to Application No. PCT/JP02/08053 dated Nov. 26, 2002.
Nishihara Kazunari
Nomura Koji
Tajika Hirofumi
Toji Motoyuki
Fayyaz Nashmiya
Matsushita Electric - Industrial Co., Ltd.
RatnerPrestia
Williams Hezron
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