Driving circuit, method of testing driving circuit,...

Details Driving circuit, method of testing driving circuit,... Driving circuit, method of testing driving circuit,...

2006-06-20

2006-06-20

Tan, Vibol (Department: 2819)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C345S087000, C345S100000

Reexamination Certificate

active

07064573

ABSTRACT:
To provide a highly-reliable testing method of a level shifter, a driving circuit of an electro-optical panel includes a shift register, a level shifter, and a logic operation device. The shift register sequentially outputs first transfer pulses from a plurality of stages. The level shifter shifts the voltage level of each of sequentially-output first transfer pulses thereby outputting a sequence of second transfer pulses as driving signals. The logic operation device performs a logic operation on sequentially-output second transfer pulses thereby outputting test signals the number of which is smaller than the number of stages of the shift register.

REFERENCES:
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patent: 2001/0030636 (2001-10-01), Ito et al.
patent: 2003/0006978 (2003-01-01), Fujiyoshi
patent: 2003/0132906 (2003-07-01), Tanaka et al.
patent: 2004/0183563 (2004-09-01), Her et al.
patent: 2004/0183772 (2004-09-01), Nakajima et al.
patent: A 7-20826 (1995-01-01), None
patent: A 8-62580 (1996-03-01), None

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