Driving circuit for solid-state image sensor and counter circuit

Electrical pulse counters – pulse dividers – or shift registers: c – Counting or dividing in incremental steps – Beam type tube

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377 55, 377 29, 371 221, H03K 2140

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active

053717732

ABSTRACT:
A counter circuit includes counting stages of n bits where n is a natural number. The counter circuit also includes a logic decoding circuit for determining the inputs of the counting stages, a logic circuit for adjusting the number of simultaneous changes so that the number of simultaneous changes of the logic decoding circuit can be made uniform, and a logic circuit for adjusting the load capacitance of the counting stages so that the load capacitance can be made uniform. The counter circuit may also include a test logic circuit for creating a test wave form on the basis of the outputs from the logic circuits for adjusting the number of simultaneous changes and the logic circuits for adjusting the load capacitance. Accordingly, it is possible to detect a failure of the logic circuits for adjusting the number of simultaneous changes and the logic circuits for adjusting the load capacitance which does not effect the counting output.

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patent: 5075892 (1991-12-01), Choy
F. Tsui, "Testing of Memory Parts", in IBM Technical Disclosure Bulletin, vol. 25, No. 3A, pp. 1216-1227.
E. F. Hahn & C. J. Starsiak, "VLSI Testing by On-Chip Error Detection", in IBM Technical Disclosure Bulletin, vol. 25, No. 2, p. 709 (Jul. 1982).
"Embedded Array Test With Ecipt", in IBM Technical Disclosure Bulletin, vol. 28 No. 6, pp. 2376-2378 (Nov. 1985).

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