Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Current driver
Patent
1993-08-03
1995-07-04
Stephan, Steven L.
Miscellaneous active electrical nonlinear devices, circuits, and
Signal converting, shaping, or generating
Current driver
327407, 327484, H03K 301, H03K 1900
Patent
active
054304008
ABSTRACT:
Driver circuits are provided which also serve as termination and clamp in an IC tester. When it is to drive a port of a device under test (DUT) between two predetermined voltage levels, the driver's I/O terminal is switched between two predetermined voltage levels with an output impedance that matches the transmission line between the driver circuit and the DUT. When the DUT's port is supplying an output signal, the driver circuit can be programmed to provide one of two types of termination. If the DUT's port is specified as capable of driving the load, the transmission line between the driver circuit and the DUT is terminated by switching the driver circuit's I/O terminal to a predetermined voltage level with an impedance of Z.sub.0. If the DUT's port is not specified as being capable of driving such a termination load, the driver circuit functions like a Z-clamp circuit.
REFERENCES:
patent: 4814638 (1989-03-01), Weick
patent: 4954729 (1990-09-01), Urai
patent: 4972157 (1990-11-01), Moyal
patent: 5245230 (1993-09-01), Ohri et al.
M. Barber, Subnanosecond timing measurements on MOS devices using modern VLSI test systems, International Test Conference, 1983, paper 8.1, pp. 170-180.
B. West, Attainable accuracy of autocalibrating VLSI test systems, International Test Conference, 1983, paper 8.4, pp. 193-199.
Cheung David K.
Herlein Richard F.
Sanielevici Sergio A.
West Burnell G.
Olsen Kenneth
Riley Shawn
Riter Bruce D.
Schlumberger Technologies Inc.
Smith Keith G. W.
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