Driver circuit for testing bi-directional transceiver semiconduc

Details Driver circuit for testing bi-directional transceiver semiconduc Driver circuit for testing bi-directional transceiver semiconduc

1990-04-30

1992-03-17

Miller, Stanley D.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

307455, 307475, 307494, 307254, H03K 301

Patent

active

050971441

ABSTRACT:
A driver circuit is disclosed for use in testing bi-directional transceiver semiconductor products using a minimum of time and number of product accessing pins. The driver includes a pair of controllable amplitude current sources whose output currents are selectably switched into or partially away from the commonly connected emitters of a current switch. The current switch is energized by a variable voltage source and produces the output test voltage.

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