Miscellaneous active electrical nonlinear devices – circuits – and – Gating – Converging with plural inputs and single output
Patent
1996-09-20
1998-07-14
Callahan, Timothy P.
Miscellaneous active electrical nonlinear devices, circuits, and
Gating
Converging with plural inputs and single output
327109, 327382, 327494, 327496, 327587, 327588, H03K 1762
Patent
active
057810591
ABSTRACT:
A driver circuit for a semiconductor test system generates test signals having predetermined voltage levels without being affected by stray capacitances. The driver circuit includes: a buffer amplifier for supplying test signals having predetermined voltage levels; a first diode bridge connected to a first voltage source for providing a first voltage level to the buffer amplifier where the first diode bridge has an upper node and an lower; a second diode bridge connected to a second voltage source for providing a second voltage level to the buffer amplifier where the second diode bridge has an upper node and an lower node; a third diode bridge connected to a third voltage source for providing a third voltage level to the buffer amplifier where the third diode bridge has an upper node and an lower node; a fourth diode bridge connected between the first voltage source and the lower node of the third diode bridge; and a fifth diode bridge connected between the second voltage source and the upper node of the third diode bridge.
REFERENCES:
patent: 5036219 (1991-07-01), Dingwall et al.
patent: 5276355 (1994-01-01), Nagata
Advantest Corp.
Callahan Timothy P.
Zweizig Jeffrey
LandOfFree
Driver circuit for semiconductor test system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Driver circuit for semiconductor test system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Driver circuit for semiconductor test system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1885956