Driver circuit for in-circuit overdrive/functional tester

Details Driver circuit for in-circuit overdrive/functional tester Driver circuit for in-circuit overdrive/functional tester

1989-04-19

1991-03-05

Zazworsky, John

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

307268, 307473, 307494, 324523, 324527, 324537, 324 731, H03K 3023, H03K 501

Patent

active

049980262

ABSTRACT:
A driver circuit for use in a circuit board tester which tester can perform both functional and in-circuit tests on a given device under test (DUT). The tester provides a test signal representative of a command for the driver circuit to provide logic high or logic low signals to a given device under test (DUT). The driver includes an output stage for providing desired logic high and logic low signals in response to the test signal; and switch circuitry, connected between the tester and the output stage, for preventing the test signal from reaching the output stage in response to a second control signal. The driver circuit is also shown to include an amplifier which, during operation of the driver circuit, receives feedback from the output stage. In addition, the driver circuit includes another output stage which provides a feedback signal when the driver circuit is in tri-state (deactivated). The driver circuit provides a low output impedance when logic high and logic low signals are being provided and a high output impedance when the driver circuit is in tri-state.

REFERENCES:
patent: 3781689 (1973-12-01), Marshall et al.
patent: 3965468 (1976-06-01), Bronson
patent: 4486674 (1984-12-01), Neely
patent: 4588945 (1986-05-01), Groves et al.
patent: 4612466 (1986-09-01), Stewart
patent: 4800294 (1989-01-01), Taylor
patent: 4814638 (1989-03-01), Weick

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