Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent
1991-10-15
1993-02-02
Sikes, William L.
Electrical transmission or interconnection systems
Nonlinear reactor systems
Parametrons
307455, 307456, 307473, 307263, 324 731, 324158R, H03K 301, H03K 19086
Patent
active
051840294
ABSTRACT:
A driver circuit for use in a circuit board tester performs both functional and in-circuit tests on a given device under test (DUT). The tester provides a control signal representative of a command for the driver circuit to provide test signals to the DUT. The driver circuit incorporates two stages: a pre-driver stage and a driver stage. The pre-driver stage consists of an amplifier connected to fast switching transistors with the ability to move in and out of saturation rapidly. The amplifier receives control signals and the switching transistors provide actuation signals to the driver stage. The driver stage comprises two emitter follower transistors that operate exclusively in an unsaturated state. The driver stage provides test signals to the DUT in response to the actuation signals from the two switching transistors of the pre-driver stage. Additionally, the driver circuit may be programmed to change the output voltage amplitudes of the test signals.
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Hewlett--Packard Company
Sikes William L.
Wambach Margaret Rose
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