Drive circuit for driving power semiconductor device

Miscellaneous active electrical nonlinear devices – circuits – and – Gating – Delay controlled switch

Reexamination Certificate

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C327S394000, C361S101000

Reexamination Certificate

active

06906574

ABSTRACT:
A drive circuit includes a gate voltage detector that detects a gate-emitter voltage Vge that appears between the gate and emitter of a power semiconductor device throughout a detection time period during which a sampler allows the process of detecting the gate-emitter voltage Vge, and that recognizes the occurrence of an abnormality in the power semiconductor device when the gate-emitter voltage Vge exceeds a reference value. Therefore, the drive circuit can protect the power semiconductor device with higher reliability by promptly detecting the occurrence of a short circuit even when the power semiconductor device is resistant to high voltages.

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patent: 6717785 (2004-04-01), Fukuda et al.
patent: 02-262826 (1990-10-01), None
patent: 04-165916 (1992-11-01), None
patent: 04-337919 (1992-11-01), None
R. Chokhawala et al., “A Discussion on IGBT Short-Circuit Behavior and Fault Protection Schemes”,IEEE Trans. Ind. Applications, 1995, pp. 256-263, 31(2).

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