Drain arrangement for photoresist coating apparatus

Fluid handling – Flow affected by fluid contact – energy field or coanda effect – Means to regulate or vary operation of device

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Details

354324, 137 92, 118688, G03D 500

Patent

active

052892220

ABSTRACT:
A photoresist drainage system for conducting the excess photoresist and solvents from a spin coating machine in a semiconductor fabrication unit is disclosed. The excess photoresist liquid and solvents are channeled directly to an exhaust manifold instead of being collected in a temporary storage tank. From the exhaust manifold the photoresist and solvents flow directly into a factory chemical reclaim system. This substantially reduces the amount of solvent vapors that are drawn into the factory exhaust system.

REFERENCES:
patent: 4185975 (1980-01-01), Scharf
patent: 4518678 (1985-05-01), Allen
patent: 4967782 (1990-11-01), Yamashita et al.

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