Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate
2007-07-17
2007-07-17
Toatley, Jr., Gregory J. (Department: 2886)
Optics: measuring and testing
By light interference
Using fiber or waveguide interferometer
Reexamination Certificate
active
10693619
ABSTRACT:
Embodiments of the present invention generally provide methods, apparatus, and systems for compensating for frequency fluctuations in source light used to interrogate an optical sensor. The optical sensor may be interrogated to generate a sensor signal. A reference device co-located with the optical sensor may also be interrogated to generate a reference signal. Optical parameters extracted from the reference signal may be used to correct parameters extracted from a sensor signal.
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patent: 6403949 (2002-06-01), Davis et al.
patent: 6522797 (2003-02-01), Siems et al.
Canadian Office Action, Application No. 2,485,030, dated Mar. 23, 2006.
Detschel Marissa J.
Optoplan AS
Patterson & Sheridan LLP
Toatley , Jr. Gregory J.
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