Doubled ended spring probe ring interface for multiple pin test

Details Doubled ended spring probe ring interface for multiple pin test Doubled ended spring probe ring interface for multiple pin test

1995-07-24

1996-12-17

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324758, G01R 104, H01R 458, H01R 900, H05K 720

Patent

active

055857396

ABSTRACT:
The present invention relates to a double ended spring probe ring interface for multiple pin test heads, such as a 120 pin sentry style test head. The double ended spring probe ring is comprised of a non-conductive ring having a plurality of apertures equally spaced along an outer radius of the ring. A plurality of double-ended spring probes are held in the ring by a holding device which is coupled to each spring probe. The holding device holds the spring probe within the ring so as to maintain coplanarity among the spring probes.

REFERENCES:
patent: 3648002 (1972-03-01), Du Rocher
patent: 4252391 (1981-02-01), Sado
patent: 4885662 (1989-12-01), Bartholomew et al.
patent: 5410260 (1995-04-01), Kazama
patent: 5417577 (1995-05-01), Holliday et al.

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