Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
1997-11-26
2001-03-06
Ballato, Josie (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB, C209S574000
Reexamination Certificate
active
06198291
ABSTRACT:
FIELD OF THE INVENTION
The present invention relates to a tester and its method for a microelectronic device and more particularly, to a double-speed tester and its method for a microelectronic device, in which recesses, formed in predetermined intervals on the circumference of a disk-shaped test plate, accommodate microelectronic devices, such as multi-layer ceramic capacitors (MLCC), and the test plate rotates by two steps at one time, to thereby test them at two points.
BACKGROUND OF THE INVENTION
Generally speaking, such microelectronic devices as MLCCs are chosen after the failure/quality test at a final process in their manufacturing procedure. For the test, the electric devices are aligned on a test plate, and a probe makes contact therewith.
FIG. 1A
shows a section of an electric device tester,
1
B being a plan view of the test plate of
FIG. 1A
with the microelectronic devices mounted. As shown in these drawings, the microelectronic device tester includes: a test plate
11
in which recesses
15
are formed on the circumference of a disk at predetermined intervals to receive microelectronic devices
16
therein; a motor
12
for rotating test plate
11
; a probe
13
installed at its measurement location and making contact with one of the microelectronic devices
16
; and a meter
14
for measuring microelectronic devices
16
through probe
13
.
In order to measure microelectronic devices, they are first aligned in recesses
15
formed on the disk-shaped test plate. Motor
12
is then driven to rotate test plate
11
. When test plate
11
rotates for devices
16
to reach their test locations, motor
12
stops, and then probe
13
makes contact with devices
16
reached. Meter
14
measures devices
16
received in recesses
15
of test plate
11
through probe
13
connected to devices
16
.
FIG. 2
is a block diagram of a conventional tester for microelectronic devices. This tester contains: a probe
23
installed at its measurement location to make contact with the devices
22
accommodated in test plate
21
's recesses; an RLC meter
24
for measuring devices
22
through probe
23
; a flash tester
25
for checking the insulation of devices
22
by applying a high voltage thereto; a motor controller
26
for controlling the rotation speed and position of a motor which rotates test plate
21
; a monitor
27
for displaying the devices' measurement status and information required; and a microcomputer
28
for outputting a control signal which controls the motor's speed and location so that test plate
25
places each devices
22
at the measurement location, and for comparing the measurement result of RLC meter
24
and flash tester
25
with reference data in order to find out the devices' quality or failure.
FIG. 3A
shows a circumferential section of the test plate for explaining the operation of the conventional tester. In this drawing recesses
32
are formed on the circumference of test plate
31
at a predetermined interval, each containing microelectronic device
33
. When the motor is driven to rotate the test plate, it moves by one step from the current recess to the next, and then the motor stops. In this situation a device
33
to be measured stops at the measurement location, and the probe installed thereat makes contact with the device
33
in order to check its quality or failure.
FIG. 3B
is a timing diagram of the operation of the conventional tester for microelectronic devices, showing the time period taken for the tester's movement and measurement with respect to the time axis. According to
FIG. 3B
, the movement time is taken longer than the measurement time because the test plate rotates only by one step between the recesses containing the microelectronic devices to thereby measure a single device at the location moved. This effect does not afford a great amount of products.
SUMMARY OF THE INVENTION
Therefore, in order to overcome such drawbacks of the prior art, an object of the present invention is to provide a double-speed tester for a microelectronic device, in which a plurality of microelectronic devices are received in recesses formed at a predetermined interval on the circumference of the disk-shaped test plate, and this plate is rotated two steps at one time, in order to measure the devices at two points.
To accomplish the object of the present invention, there is provided a double-speed tester for a microelectronic device, in which a plurality of recesses is formed on the circumference of a test plate at an interval of step, the recesses each accommodating a microelectronic device which is measured with the test plate rotating, the tester comprising: a motor controller for controlling a motor so that the test plate rotates two steps at one time; a first connector installed at a first measurement location for connecting to the microelectronic device which stops thereat; a second connector installed at a second measurement location adjoining the first measurement location at an interval of one step, for connecting to a microelectronic device which stops at the second measurement location; a first measurer connected to the first connector for measuring the microelectronic device connected to the first connector; a second measurer connected to the second connector for measuring the microelectronic device connected to the second measurer; a first testing section for applying a high voltage to the microelectronic device whose value is measured by the first measurer, in order to check the degree of its insulation; a second testing section for applying a high voltage to the microelectronic device whose value is measured by the second measurer, in order to check the degree of its insulation; and a microcomputer for outputting a control signal which turns ON or OFF the operation of the motor in order to rotate the test plate, and comparing the value measured by the first or second measurer, with reference data, in order to check the microelectronic device's failure or quality, the microcomputer further checking the quality of insulation of the microelectronic device according to the insulation test result by the first or second testing section.
According to another aspect of the present invention, there is provided a double-speed tester for a microelectronic device, in which a plurality of recesses is formed on the circumference of a test plate at an interval of step, the recesses each accommodating a microelectronic device which is measured with the test plate rotating, the tester comprising: a motor controller for controlling a motor so that the test plate rotates two steps at one time; a first connector installed at a first measurement location for connecting to the microelectronic device which stops thereat; a second connector installed at a second measurement location adjoining the first measurement location at an interval of one step, for connecting to a microelectronic device which stops at the second measurement location; a measurer for measuring the microelectronic device; a scanning section connected between the first and second connectors and the measurer for connecting the first and second connectors sequentially to the measurer; a first testing section connected to the first connector for applying a high voltage to the microelectronic device whose value is measured by the first connector, in order to check the degree of its insulation; a second testing section connected to the second connector for applying a high voltage to the microelectronic device whose value is measured by the second connector, in order to check the degree of its insulation; and a microcomputer for outputting a control signal which turns ON or OFF the operation of the motor in order to rotate the test plate, and comparing the value measured by the measurer, with reference data, in order to check the microelectronic device's failure or quality, the microcomputer further checking the quality of insulation of the microelectronic device according to the insulation test result by the first or second testing section.
According
Han Yoon Heung
Lim Houng Gyu
Yu Seok Jong
Ballato Josie
Samsung Electro-Mechanics Co. Ltd.
Sundaram T. R.
Webb Ziesenheim & Logsdon Orkin & Hanson, P.C.
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