Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Patent
1998-09-02
2000-02-08
Rosasco, S.
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
G03F 900
Patent
active
060226455
ABSTRACT:
A double photomask includes two complementary pattern layers respectively formed on each surface of a transparent substrate. A full pattern is a combined pattern of these two complementary pattern layers. These two complementary pattern layers are formed separately on the different surfaces. The double-sided photomask also includes a shifter layer for a phase shifting mask.
REFERENCES:
patent: 5248575 (1993-09-01), Ogoshi
patent: 5358809 (1994-10-01), Van Berkel
patent: 5387484 (1995-02-01), Doany et al.
patent: 5498497 (1996-03-01), Kim et al.
patent: 5733686 (1998-03-01), Shimizu
Rosasco S.
United Microelectronics Corp.
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