Double-sided automatic test equipment probe clamshell with vacuu

Details Double-sided automatic test equipment probe clamshell with vacuu Double-sided automatic test equipment probe clamshell with vacuu

1993-02-08

1995-07-25

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324761, G01R 3102, G01R 1073

Patent

active

054365678

ABSTRACT:
A two-sided probe and clamshell fixture embodiment of the present invention comprises a vacuum-actuated bed-of-nails for probing the bottom side of a printed circuit board (PCB) device-under-test (DUT) and a pushrod-actuated bed-of-nails for probing the top side of the printed circuit board device-under-test. The fixture comprises a base, a bottom frame, and a bottom plate that are sealed for vacuum actuation by a gasket. When in place, the DUT completes the vacuum seal and the bottom bed-of-nails which includes a patterned array of spring loaded probe pins reaches through the bottom plate to contact probe points on the DUT. A set of push rods attached to the base push out through the bottom frame and operate a set of gear boxes attached to the outer edges of a top plate within a top frame. A patterned array of spring-loaded probe pins reaches through the top plate to contact probe points on the topside of DUT when a vacuum applied to the bottom assembly causes the pushrods to advance and operate the gear boxes. The gear boxes reverse the direction of force received to cause the topside pushrod-actuated bed-of-nails to engage the DUT.

REFERENCES:
patent: 3701021 (1972-10-01), Isaac et al.
patent: 3970934 (1976-07-01), Aksu
patent: 4101830 (1978-07-01), Greig
patent: 4225819 (1980-09-01), Grau et al.
patent: 4322682 (1982-03-01), Schadwill
patent: 4344033 (1982-08-01), Stowers et al.
patent: 4352061 (1982-09-01), Matrone
patent: 4357062 (1982-11-01), Everett
patent: 4857009 (1989-08-01), Christensen

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