Double polysilicon bipolar transistor and method of...

Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of...

Reexamination Certificate

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C438S312000, C438S361000

Reexamination Certificate

active

06936519

ABSTRACT:
A bipolar transistor, and manufacturing method therefor, with a substrate having a collector region and a base structure provided thereon. An emitter structure is formed over the base structure and an extrinsic base structure is formed over the base structure and over the collector region beside and spaced from the emitter structure. A dielectric layer is deposited over the substrate and connections are formed to the extrinsic base structure, the emitter structure and the collector region.

REFERENCES:
patent: 4903104 (1990-02-01), Kawai et al.
patent: 5365090 (1994-11-01), Taka et al.
patent: 5494836 (1996-02-01), Imai
patent: 5773350 (1998-06-01), Herbert et al.
patent: 6169007 (2001-01-01), Pinter
E.Ohue, K. Oda, R. Hayami, and K. Washio, “A 7.7-ps CML Using Selective-Epitaxial SiGe HBTs”,Proc. IEEE BCTM, pp. 97-100. 1998.
K. Washio, M. Kondo, E. Ohue, K. Oda, R. Hayami, M. Tanabe, H. Shimamoto, and T. Harada, “A 0.2-μm Self-Aligned SiGe HBT Featuring 107-GHz fmaxand 6.7-ps ECL”, IEDM Tech Dig. Of Papers, pp. 557-560, 1999.
D.L. Harame, H.H. Comfort, J.D. Cressler, E.F. Crabbé, J. Y.-C. Sun, B.S. Meyerson, and T. Tice, “Si/SiGe Epitaxial-Base Transistors—Part I: Materials, Physics, and Circuits”, IEEE Transactions on Electronic Devices, vol. 42, No. 3, pp. 455-468, Mar. 1995.
D.L. Harame, H.H. Comfort, J.D. Cressler, E.F. Crabbé, J. Y.-C. Sun, B.S. Meyersonn, and T. Tice, “Si/SiGe Epitaxial-Base Transistors—Part II: Process Integration and Analog Applications”, IEEE Transactions on Electronic Devices, vol. 42, No. 3, pp. 469-482, Mar. 1995.

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