Double-path interferometer

Details Double-path interferometer Double-path interferometer

1987-03-26

1989-06-06

McGraw, Vincent P.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356358, 356363, G01B 902

Patent

active

048366781

ABSTRACT:
A double-path interferometer comprises first and second polarized beam splitters disposed side by side on a light path from a light source, a half-wave plate interposed between the first and second polarized beam splitters, a cube corner prism, a reflecting mechanism disposed on the light path of the cube corner prism ahead of the two splitters, and a quarter-wave plate for causing a 90-degree rotation of the polarization plane in forward and backward light paths with respect to the reflecting mechanism.

REFERENCES:
patent: 3790284 (1974-02-01), Baldwin
patent: 4787747 (1988-11-01), Sommargren

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