Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1985-05-10
1987-07-07
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
G01J 345, G01B 902
Patent
active
046783334
ABSTRACT:
Apparatus and method for converting a conventional Michelson interferometer into a high resolution double-pass interferometer. The Michelson interferometer includes means for dividing an incident beam of radiation into first and second beams, means for propagating the first and second beams through first and second optical paths, respectively, means for recombining the first and second beams to form an output beam of radiation, and means for detecting an interference pattern in the output beam of radiation. The improvement comprises a beam splitter which is positioned to return a portion of the output beam of radiation to the interferometer as an incident beam of radiation, and a bandpass filter which is positioned between the beam splitter and the detector to filter from the output beam of radiation a portion which has been twice passed through the interferometer.
REFERENCES:
Hariharan et al., "Fringes of Equal Inclination in the Double-Passed Michelson Interferometer" J. Opt. Soc. Am., vol. 51, No. 6, pp. 617-619, Jun. 1961.
Koren Matthew W.
Nicolet Instrument Corporation
Willis Davis L.
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