Optics: measuring and testing – By dispersed light spectroscopy – With monochromator structure
Patent
1999-07-09
2000-12-26
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
With monochromator structure
G01J 318
Patent
active
061668052
ABSTRACT:
The present invention relates to a double pass monochromator that improves wavelength resolution and reduces the actual length thereof. A return reflection means 7 that reverses the direction of dispersion of the wavelength of the second pass light 1c, 1f emitted and incident on a diffraction grating 4 during the reflection. In addition, the angles of the incident and emitted light during separation of spectral components by the diffraction grating are identical during the first and second diffraction.
REFERENCES:
patent: 2922331 (1960-01-01), Fastie et al.
patent: 3888590 (1975-06-01), White
Kaneko Tsutomu
Kojima Manabu
Mori Tohru
Ando Electric Co. Ltd.
Evans F. L.
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