Optics: measuring and testing – By dispersed light spectroscopy – With monochromator structure
Patent
1990-12-10
1992-10-20
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
With monochromator structure
356334, G01J 318
Patent
active
051574560
ABSTRACT:
A double monochromator comprises an inlet slit 20, which is imaged in the plane of an intermediate slit 34 through a first grating monochromator 36. The intermediate slit 34 is imaged in the plane of the outlet slit 34 through a second grating monochromator 58 identical with the first grating monochromator 36. Deflecting mirrors 64 and 66 can be moved into the path of rays to enable such a double monochromator to be optionally used as a single monochromator with increased light flux. An additional slit is arranged between the deflecting mirrors 64 and 66. The arrangement is such so that essentially identical beam geometries result at the outlet in both of the operation modes.
REFERENCES:
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patent: 4697924 (1987-10-01), Akiyama
patent: 4981357 (1991-01-01), Minakawa et al.
"Journal Physics E/Scientific Instruments", Aug. 1988, pp. 798-804.
V. Mazzacurati et al.: "A New Class of Multiple Dispersion Grating Spectrometers".
"Patent Abstracts of Japan" vol. 4, No. 14 (E-114)(169) 31, Jan. 31, 1980.
"Double Spectroscope", Hitachi Seisakusho K.K., Dec. 5, 1979.
Bodenseewerk Perkin Elmer GmbH
Evans F. L.
Grimes Edwin T.
Murphy Thomas P.
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