Double-mirror short-circuit detection

Details Double-mirror short-circuit detection Double-mirror short-circuit detection

2005-11-22

2005-11-22

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S523000, C324S765010, C361S018000, C361S079000

Reexamination Certificate

active

06967488

ABSTRACT:
The current mirror configuration includes four branches, a biasing branch, a first comparator branch, a second comparator branch and a measurement branch. The measurement branch is connected to a pad of the IC device and a measurement current is charged on to the pad. The measurement current is mirrored from the current of the biasing branch and the measurement current is mirrored to the second comparator branch. The biasing branch is mirrored to the first comparator branch using a scale that the current of the first comparator branch is smaller than the current of the biasing branch. In case of a short-circuit, the current of the measurement branch is larger than the current of the first comparator branch.

REFERENCES:
patent: 5973569 (1999-10-01), Nguyen
patent: 6008972 (1999-12-01), Pietrobon
patent: 6657877 (2003-12-01), Kashima et al.
patent: 6680835 (2004-01-01), Tabata
patent: 6683765 (2004-01-01), Kanamori
patent: 0061730 (1982-10-01), None
patent: 2003283314 (2003-10-01), None
Co-pending U.S. Patent App. DS-04-015, “Self-Mirroring Current Mirror,” Serial #10/874,473, filed Jun. 22, 2004, assigned to the same assignee.

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