Dynamic magnetic information storage or retrieval – Head – Magnetoresistive reproducing head
Reexamination Certificate
2005-03-22
2005-03-22
Barrera, Ramon M. (Department: 2832)
Dynamic magnetic information storage or retrieval
Head
Magnetoresistive reproducing head
C360S324100, C428S690000, C428S690000, C428S690000, C029S603140
Reexamination Certificate
active
06870711
ABSTRACT:
A pinned/pinning layer configuration of the form: AP1/coupling bilayer/AP2/AFM, suitable for use in a CIP or CPP GMR sensor, a TMR sensor or an MRAM element, is found to have improved magnetic stability, yield good values of dR/R and have high values of saturation magnetization that can be adjusted to meet the requirements of magnetic field annealing. The coupling bilayer is a layer of Ru/Rh or their alloys, which provides a wide range of coupling strengths by varying either the thickness of the Ru layer or the Rh layer.
REFERENCES:
patent: 5465185 (1995-11-01), Heim et al.
patent: 5701223 (1997-12-01), Fontana, Jr. et al.
patent: 5841692 (1998-11-01), Gallagher et al.
patent: 6153320 (2000-11-01), Parkin
patent: 6612018 (2003-09-01), Gill
patent: 6620530 (2003-09-01), Li et al.
patent: 6667901 (2003-12-01), Perner et al.
patent: 6731477 (2004-05-01), Lin et al.
“Oscillations in Exchange Coupling and Magneto—resistance in Metallic Superlattice Structures; Co/Ru, Co/Cr, and Fe/Cr,” Phys. Rev. Lett., vol. 64, No. 19, May 7, 1990, pp. 2304-2308.
Li Yun-Fei
Torng Chyu-Jiuh
Wang Hui-Chuan
Zhao Tong
Ackerman Stephen B.
Barrera Ramon M.
Headway Technologies Inc.
Saile George D.
LandOfFree
Double layer spacer for antiparallel pinned layer in CIP/CPP... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Double layer spacer for antiparallel pinned layer in CIP/CPP..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Double layer spacer for antiparallel pinned layer in CIP/CPP... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3382008