Double-headed spring contact probe assembly

Details Double-headed spring contact probe assembly Double-headed spring contact probe assembly

1992-03-10

1993-07-13

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, 439482, G01R 1512, H01R 440

Patent

active

052277186

ABSTRACT:
A double-headed spring contact probe for loaded board testing includes a barrel having a hollow interior and opposite plungers which slide axially in the barrel. The plungers have outer portions which extend through opposite open ends of the barrel, each terminating in a contact tip outside the barrel for contacting a test point on a circuit board. One of the plungers has a hollow receptacle extending into the barrel with a rectangular or notched keyway opening into the receptacle. The other plunger has a twisted guide member extending through the barrel into the keyway of the other plunger whereby axial translation of the plungers relative to each other causes a rotation thereof. A spring engages opposite collar portions of the plungers to bias the plungers outwardly against opposite ends of the barrel. Necked portions of the barrel limit travel of the plungers out from the barrel. An electrical interface board includes a frame including an insulating substrate and an array of double-headed probe assemblies extending axially through the frame.

REFERENCES:
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patent: 4636026 (1987-01-01), Cooney et al.
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patent: 5032787 (1991-07-01), Johnston et al.
patent: 5034749 (1991-07-01), Jungblurt et al.
"Spring Plunger Contact", by Buyck et al., IBM Tech. Disc. Bull., vol. 15, #1, Jun. 1972, p. 58.

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