Double-headed spring contact probe assembly

Details Double-headed spring contact probe assembly Double-headed spring contact probe assembly

1993-04-21

1995-05-30

Nguyen, Vinh

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 725, 439482, G01R 1512, H01R 440

Patent

active

054205190

ABSTRACT:
A double-headed spring contact probe for loaded board testing including a barrel having a hollow interior and opposite plungers which slide axially in the barrel is described. The plungers have outer portions which extend through the opposite open ends of the barrel, each terminating in a contact tip outside the barrel for contacting a test point on a circuit board. One of the plungers has a hollow receptacle extending into the barrel with a rectangular or notched keyway opening into the receptacle. The keyway is disposed at an angle of about 6.degree. to the longitudinal axis thereof. The other plunger has a twisted guide member extending through the barrel into the keyway of the other plunger whereby axial translation of the plungers relative to each other causes a rotation thereof and the keyway rides in the groove for electrical contact as translational movement occurs. A leafspring is further provided on the hollow receptacle adjacent the notched keyway for contacting the twisted guide member of the other plunger to minimize electrical resistance during axial translation. In addition, the plunger may have an open end extending from the barrel with inwardly directed fingers for engaging a contact tip for retaining the same therein.

REFERENCES:
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"Spring Plunger Contact", by Buyck et al., IBM Tech Disc. Bull., vol. 15, No. 1, Jun. 1972, p. 58.

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