Double focussing mass spectrometer

Details Double focussing mass spectrometer Double focussing mass spectrometer

1981-11-27

1984-01-24

Smith, Alfred E.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

H01J 4932

Patent

active

044278853

ABSTRACT:
A mass spectrometer comprising an ion source for producing an ion beam, an ion optical system having an entrance and an exit slit, and an ion detector. The ion optical system comprises a series combination of an energy dispersing unit and a mass dispersing unit. The energy dispersing unit comprises a toroidal electrical field having a deflection angle of 85.degree. to 95.degree. while the mass dispersing unit comprises a homogeneous magnetic field having a deflection angle of 85.degree. to 95.degree. and an entrance end face made concave as viewed from the entrance side of the ion beam when the apparatus is operated as a double focussing mass spectrometer of the reverse geometry type and an exit end face inclined 6.degree. to 14.degree. to the negative side from a position perpendicular to the axis of the ion optical system.

REFERENCES:
patent: 3061720 (1962-10-01), Ewald
patent: 3194961 (1965-07-01), Ewald et al.
patent: 3541328 (1970-11-01), Enge
patent: 3866042 (1975-02-01), Vastel

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