Double-focusing mass spectrometer having Wien filter and MS/MS i

Details Double-focusing mass spectrometer having Wien filter and MS/MS i Double-focusing mass spectrometer having Wien filter and MS/MS i

1988-04-12

1989-09-12

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250281, H01J 4932

Patent

active

048662674

ABSTRACT:
A double-focusing mass spectrometer comprising a Wien filter and a homogeneous magnetic field. Daughter ions produced from parent ions of a certain ionic species differ in mass but have velocities substantially equal to that of the parent ions. The Wien filter is set up such that the velocities of the daughter ions satisfy the Wien condition. Thus, the daughter ions originated from the specified parent ions pass through the filter and are dispersed according to mass by the homogeneous magnetic field and focused into a focal plane. A two-dimensional ion detector is disposed along this focal plane in order to simultaneously detect said daughter ions and to obtain a spectrum of the daughter ions.

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patent: 4645928 (1987-02-01), Naito
patent: 4694169 (1987-09-01), Uchida

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