Double focusing mass spectrometer and MS/MS arrangement

Details Double focusing mass spectrometer and MS/MS arrangement Double focusing mass spectrometer and MS/MS arrangement

1989-01-24

1990-05-08

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250396ML, 250299, H01J 4932

Patent

active

049240900

ABSTRACT:
The invention relates to a double focusing mass spectrometer with a combination of an electric and of a magnetic field for directional and velocity focusing. In order to provide a compact and constructionally simple arrangement, it is proposed that a common magnet is used for the Wien filter (10) and the sector magnet (11). Preferably, this double focusing mass spectrometer is used in an MS/MS arrangement.

REFERENCES:
patent: 4019989 (1977-04-01), Hazewindas et al.
patent: 4022876 (1977-10-01), Anbar
patent: 4054796 (1977-10-01), Naito
patent: 4066895 (1978-01-01), Iwanaga
patent: 4521687 (1985-06-01), Naito
patent: 4645928 (1987-02-01), Naito
"In Optics Multipoles", Boerboom, Nucl. Ins. and Methods in Physics Research, pp. 426-430, 1987.
"Compact Double Focusing Mass Spectrometer Design for Partical Pressure Measurements", D. Ioanoviciu et al., Vacuum, vol. 24, No. 6, pp. 245-247, 1974.
"Development of a Fast Ion Mass Spectrometer for Space Research", Hahn et al., Rev. Sci. Inst., vol. 52, No. 2, pp. 247-255, Feb. 1981.

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