Double focusing mass spectrometer

Details Double focusing mass spectrometer Double focusing mass spectrometer

1981-06-05

1983-11-29

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250298, D01D 5944

Patent

active

044182805

ABSTRACT:
A double focusing mass spectrometer having a diverging electrostatic field, a converging electrostatic field and a converging magnetic field. The two electrostatic fields are connected with each other without substantial free space therebetween. The ion beam passes through the electrostatic fields coming to an intermediate focus point adjacent to the ion exit boundary of said converging electrostatic field. The beam then passes through the magnetic field to satisfy the double focusing condition in combination with the electrostatic field. Very small image magnification and aberration free focusing are obtained by this mass spectrometer.

REFERENCES:
patent: 3061720 (1962-10-01), Ewald
patent: 3202817 (1965-08-01), Belbeoch
patent: 3920988 (1975-11-01), Taya et al.
patent: 3944827 (1976-03-01), Matsuda

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