Double-faced detecting devices for an electronic substrate

Details Double-faced detecting devices for an electronic substrate Double-faced detecting devices for an electronic substrate

2005-05-24

2005-05-24

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S758010

Reexamination Certificate

active

06897668

ABSTRACT:
Double-faced detecting devices for an electronic substrate, the detecting device have a base and two probe-detecting machines oppositely located beside the base. The base has a guiding groove and a substrate platform with a through hole rotatably and movably mounted on the base via the guiding groove. Therefore, when the electronic substrate mounts on the substrate platform, the substrate platform enables to rotate from a horizontal position to a vertical position to expose two faces of the electronic substrate to face the two probe-detecting machines for a double-faced detection of the electronic substrate in high-frequency properties. Additionally, each probe-detecting machine is mounted on a pivot base and pivoted by the pivot base to adjust the height of probe to touch the electronic substrate at the vertical position.

REFERENCES:
patent: 3453545 (1969-07-01), Oates
patent: 3551807 (1970-12-01), Burke et al.
patent: 3701021 (1972-10-01), Issac et al.

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