Double crystal X-ray spectrometer

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

378 84, 378 85, G01N 23223, G21K 106

Patent

active

047529458

ABSTRACT:
A Dual Channel Spectrometer system is provided for measurement of X-ray spectra in which at least two pairs of crystals are arranged in a crystal changer so that different pairs of such crystals can be selected in the X-ray spectrometer. This selection is achieved by rotating a drum on which pairs of crystals are mounted about an axis to bring one pair of crystals into alignment with a collimated X-ray beam. This enables the selection of the wavelength range used in the spectrometer to be made without deactivating the spectrometer or without loosing the vacuum in the spectrometer.

REFERENCES:
patent: H313 (1987-07-01), Standenmann et al.
patent: 3160747 (1964-12-01), De Vries
patent: 3439163 (1969-04-01), De Jongh
patent: 4236072 (1980-11-01), Schinkel et al.
patent: 4472825 (1984-09-01), Jenkins

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Double crystal X-ray spectrometer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Double crystal X-ray spectrometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Double crystal X-ray spectrometer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-933993

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.