Double crystal X-ray spectrometer

Details Double crystal X-ray spectrometer Double crystal X-ray spectrometer

1982-05-26

1984-09-18

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 83, 378 85, G01N 2322

Patent

active

044728255

ABSTRACT:
A two crystal detection system is provided for the measurement of X-ray spectra in which two half crystals are arranged at a fixed angular difference and each crystal is read out by a separate gas detector. In such a structure, both short "d" and long "d" spacings may be simultaneously measured. This construction of the present invention yields two integrated scanning channels in which both wavelength spectra can simultaneously be achieved.

REFERENCES:
patent: 3060314 (1962-10-01), Wytzes
patent: 3397312 (1968-08-01), Okano
patent: 3980568 (1976-09-01), Pitchford

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