Double confocal scanning microscope

Optical: systems and elements – Compound lens system – Microscope

Reexamination Certificate

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C359S368000, C359S385000

Reexamination Certificate

active

07054062

ABSTRACT:
The present invention concerns a double confocal scanning microscope (1) having an illuminating beam path (2) of at least one light source (3), and a detected beam path (4) of at least one detector (5), and in order to achieve almost the theoretically possible resolution capability, in particular in the context of multi-color fluorescence applications, is characterized in that the optical properties in particular of the components (6, 10, 13, 14) arranged in the beam path are coordinated with one another in such a way that the accumulated aberrations, with respect to the optical axis (33) and/or at least one surface (18, 19, 20) in the specimen region, are at least of the order of magnitude of the theoretically achievable resolution capability.

REFERENCES:
patent: 4965441 (1990-10-01), Picard
patent: 5386112 (1995-01-01), Dixon
patent: 5790242 (1998-08-01), Stern et al.
patent: 39 18 412 (1980-02-01), None
patent: 0 491 289 (1991-12-01), None
patent: 2001-272605 (2001-10-01), None

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