Optical: systems and elements – Compound lens system – Microscope
Reexamination Certificate
2005-05-10
2005-05-10
Nguyen, Thong Q (Department: 2872)
Optical: systems and elements
Compound lens system
Microscope
C359S368000, C359S385000
Reexamination Certificate
active
06891670
ABSTRACT:
The present invention concerns a double confocal scanning microscope having an illuminating beam path (1) of a light source (2) and a detection beam path (3) of a detector (4), and in order to eliminate at their cause the problems of reconstruction methods. To do so, at least one optical component (24, 25) acting on the illuminating and/or detection beam path (1, 3) is provided, and is configured in such a way that it influences the amplitude and/or phase and/or polarization of the light; and the characteristics of the double confocal illumination and/or detection are thereby modifiable.
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Bewersdorf Joerg
Gugel Hilmar
Hell Stefan W.
Houston Eliseeva LLP
Leica Microsystems Heidelberg GmbH
Nguyen Thong Q
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