Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1984-03-08
1986-04-29
McGraw, Vincent P.
Optics: measuring and testing
By particle light scattering
With photocell detection
G01J 345, G01B 902
Patent
active
045853452
ABSTRACT:
A double beam interferometer using the refractive scanning method is disclosed which includes a first fixed optical body having a pair of parallel principal surfaces, a second fixed optical body having a pair principal surfaces, one of which faces and is parallel to one principal surface of the first fixed optical body, and the other of which makes a predetermined angle with the one principal surface of the second fixed optical body, a movable optical body having a pair of principal surfaces, one of which faces and is parallel to the other principal surface of the second fixed optical body, and the other of which makes the predetermined angle with the one principal surface of the movable optical body in such a manner that the predetermined angle of the second fixed optical body and the predetermined angle of the movable optical body are formed on opposite sides, driving means for moving the movable optical body on a plane containing the one principal surface of the movable optical body, a semitransparent mirror provided on one of facing principal surfaces of the first and second fixed optical bodies for dividing light from a light source into transmitted light and reflected light, and first and second reflecting mirrors for reflecting the transmitted light and reflected light in a direction opposite to an incident direction, respectively.
REFERENCES:
patent: 3109049 (1963-10-01), Williams
patent: 3450476 (1969-06-01), Rando
patent: 4165938 (1979-08-01), Doyle
patent: 4190366 (1980-02-01), Doyle
patent: 4265540 (1981-05-01), Doyle
patent: 4286877 (1981-09-01), Clark
"Refractively Scanned Interferometer for Fourier Transform Infrared Spectrophotometry", Doyle et al., Applied Spectroscopy, vol. 34, No. 5, 1980, pp. 599-603.
Hitachi , Ltd.
McGraw Vincent P.
Turner S. A.
LandOfFree
Double beam interferometer using refractive scanning method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Double beam interferometer using refractive scanning method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Double beam interferometer using refractive scanning method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-138961