Double acting spring probe

Details Double acting spring probe Double acting spring probe

2006-05-16

2006-05-16

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07046021

ABSTRACT:
A probe for test connecting an apparatus contact of a probe apparatus with a test contact of a tested electronic device along a contacting axis has a top structure, a bottom structure a spring member and a guide. The guide may be an outer guide face of the spring member or be part of the bottom or top structure in the form of a circumferential recess or a snap finger. The probe may be guided either slide ably in a rigid carrier structure and/or via its circumferential recess in one or two flexible membranes snapped on a rigid support frame. The probes may be simultaneously fabricated in large numbers by micro fabrication techniques with a fixed fabrication pitch and assembled in a probe apparatus with a probe pitch independently of the fabrication pitch.

REFERENCES:
patent: 5576631 (1996-11-01), Stowers et al.
patent: 5936421 (1999-08-01), Stowers et al.

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