Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Reexamination Certificate
2007-05-22
2007-05-22
Dang, Hung Xuan (Department: 2873)
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
Reexamination Certificate
active
11013597
ABSTRACT:
An ophthalmic placido pattern10is used to determine a curvature of an anterior surface of a cornea of an eye. The pattern10includes a series of alternating light and dark concentric rings12and14centered about a central point16. A series of shaped geometric shapes18and20are placed about at least some of the concentric rings12and14. The shapes18and20are of a contrasting color with respect to the ring12or14on which the shape18or20is placed.
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patent: WO 99/34725 (1999-07-01), None
International Search Report (PCT/ISA/220) and Written Opinion (PCA/ISA/237) mailed on Apr. 19, 2006.
Allred Lloyd G.
Grove Donald Charles
Bausch and Lomb Incorporated
Dang Hung Xuan
Martinez Joseph
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