Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Patent
1984-06-27
1985-09-03
Pianalto, Bernard D.
Coating processes
Measuring, testing, or indicating
Thickness or uniformity of thickness determined
427 38, B05D 306
Patent
active
045392170
ABSTRACT:
A method and apparatus for measuring and compensating for neutral ions in an ion beam in the dose control system of an ion implanter. The gas pressure in the implantation volume (15) is measured, and the pressure signal is converted to an effective beam current signal in accordance with a known relationship among the gas pressure, the apparent beam current as measured by a Faraday cage and the neutral beam. The resulting effective beam current signal is inputted to the dose control system.
Eaton Corporation
Grace C. H.
Pianalto Bernard D.
Sajovec F. M.
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