Doping procedures for semiconductor devices

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

148DIG41, 148DIG48, 148DIG71, 148DIG94, 437 81, 437905, 437963, 437971, H01L 2120

Patent

active

050249673

ABSTRACT:
A process is described for making semiconductor devices with highly controlled doping profiles. The process involves minimizing or eliminating segregation effects caused by surface electric fields created by Fermi-level pinning. These electric fields act on dopant ions and cause migration from the original deposition site of the doplant ions. Dopant ions are effectively shielded from the surface electric fields by illumination of the growth surfaces and by background doping. Also, certain crystallographic directions in certain semiconductors do not show Fermi-level pinning and lower growth temperatures retard or eliminate segregation effects. Devices are described which exhibit enhanced characteristics with highly accurate and other very narrow doping profiles.

REFERENCES:
patent: 3941624 (1976-03-01), Cho
patent: 3941624 (1976-03-01), Cho
patent: 4071383 (1978-01-01), Nagata et al.
patent: 4086108 (1978-04-01), Gonda
patent: 4447276 (1984-05-01), Davies et al.
patent: 4581248 (1986-04-01), Roche
patent: 4583110 (1986-04-01), Jackson et al.
patent: 4645687 (1987-02-01), Donnelly et al.
patent: 4659401 (1987-04-01), Reif et al.
patent: 4766087 (1988-08-01), Switzer
patent: 4800100 (1989-01-01), Herbots et al.
patent: 4829021 (1989-05-01), Fraas et al.
patent: 4843029 (1989-06-01), Joyce et al.
patent: 4843031 (1989-06-01), Ban et al.
patent: 4847216 (1989-07-01), d'Avitaya et al.
patent: 4871692 (1989-10-01), Lee et al.
Crystal Growth of Bulk Crystals: Purification, Doping and Defects, by A. J. R. de Kock, Handbook on Semiconductors, vol. 3, S. P. Keller, ed., North-Holland, New York, 1980, Chap. 4, p. 251.
Impurity Profiles of GaAs Epitaxial Layers Doped With Sn, Si, and Ge Grown with Molecular Beam Epitaxy, by A. Y. Cho, Journal of Applied Physics, vol. 46, No. 4, Apr. 1975, pp. 1733-1735.
Schubert et al., "Spatial Localization of Impurities in S-Doped GaAs", Appl. Phys. Lett., 52(18), May 2, 1988, pp. 1508-1510.
Chiu et al., "Diffusion Studies of the Si S-Doped GaAs . . . ", J. Appl. Phys., 64(3), Aug. 1, 1988, pp. 1578-1580.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Doping procedures for semiconductor devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Doping procedures for semiconductor devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Doping procedures for semiconductor devices will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-145634

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.