Metal treatment – Stock – Ferrous
Patent
1975-09-02
1977-05-17
Ozaki, G.
Metal treatment
Stock
Ferrous
357 91, 148 15, 148187, 148188, H01L 2978, H01L 21265
Patent
active
040245632
ABSTRACT:
Processes for manufacturing buried channel charge coupled devices (CCDs). After formation of an insulating layer at the surface of the CCD semiconductor substrate, a dopant material, suitable for the formation of the buried channel, is ion implanted into the insulating material. Subsequent diffusion steps cause the dopant to migrate into the underlying surface of the semiconductor substrate so as to define the buried channel region below the substrate surface.
REFERENCES:
patent: 3704178 (1972-11-01), Hill
patent: 3796932 (1974-03-01), Amelio et al.
patent: 3915755 (1975-10-01), Goetzberger et al.
patent: 3918997 (1975-11-01), Mohsen et al.
patent: 3931674 (1976-01-01), Amelio
patent: 3975753 (1976-08-01), Bharat
Walden et al., Bell System Technical Journal, Sept. 1972, pp. 1635-1640.
Kim et al., NEREM 72, 1972, pp. 161-164.
Comfort James T.
Heiting Leo N.
Levine Harold
Ozaki G.
Texas Instruments Incorporated
LandOfFree
Doped oxide buried channel charge-coupled device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Doped oxide buried channel charge-coupled device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Doped oxide buried channel charge-coupled device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1838253