Dopant sources for CMOS device

Fishing – trapping – and vermin destroying

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437152, 437164, H01L 2170, H01L 2176, H01L 21331

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active

051167786

ABSTRACT:
A process is provided for doping both sidewalls (26, 28) of isolation trenches (24, 26, 28) and connector regions (46, 48) between sources (58) and gate areas (62) and between drains (60) and gate areas in silicon CMOS devices. Appropriately doped glasses (16, 18, 30) formed on the silicon substrate (14) serve as the source of doping.

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