Dopant predeposition from high pressure plasma source

Coating processes – Electrical product produced – Integrated circuit – printed circuit – or circuit board

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427 85, B05D 108

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active

043820999

ABSTRACT:
A method is provided for predepositing dopant material on semiconductor substrates. The semiconductor substrates are positioned within a high pressure plasma reactor apparatus. A high pressure rf plasma is generated in the apparatus at a pressure of about one atmosphere or greater. Dopant materials such as B.sub.2 H.sub.6, PH.sub.3, or AsH.sub.3 are introduced to the plasma and form ionized species of the dopant. The plasma and the ionized species are directed to the surface of the semiconductor substrates whereon a uniform layer of the dopant is deposited.

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patent: 4279671 (1981-07-01), Komatsu
Rand, "J. Vac. Sci. Technol.", vol. 16, No. 2, 1979, pp. 420-427.
Knights et al., "Solid State Communications", vol. 21, pp. 983-986, 1977.

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