Docking stand for analytical instrument

Radiant energy – Ionic separation or analysis – Methods

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S281000, C250S284000, C250S288000

Reexamination Certificate

active

07875847

ABSTRACT:
An analytical instrument may be docked in a stand. The stand provides electrical power, cooling, gas to purge air from an analytical gap within the instrument and/or other supplies or services to the instrument. The stand contains a contactless memory, such as an RF-ID tag, which stores information about the supplies and/or services the stand is capable of providing to the instrument. The instrument reads the stand's contactless memory and automatically sets operational parameters of the instrument in accordance with the supplies and/or services the stand is capable of providing. Thus, the instrument may automatically operate in an enhanced mode, such as at a higher x-ray beam power, as a result of being mounted in the stand.

REFERENCES:
patent: 5521371 (1996-05-01), Hotta et al.
patent: 5705818 (1998-01-01), Kelbel et al.
patent: 6412642 (2002-07-01), Charles et al.
patent: 6442639 (2002-08-01), McElhattan et al.
patent: 6459767 (2002-10-01), Boyer
patent: 7198174 (2007-04-01), Sloan
patent: 2004/0247080 (2004-12-01), Feda
patent: 2005/0009122 (2005-01-01), Whelan et al.
patent: 2005/0019943 (2005-01-01), Chaoui et al.
patent: 2005/0103840 (2005-05-01), Boles
patent: 2007/0140424 (2007-06-01), Serceki
patent: 2007/0174152 (2007-07-01), Bjornberg et al.
patent: 2008/0192897 (2008-08-01), Piorek et al.
patent: 2009/0064276 (2009-03-01), Dugas et al.
patent: 2009/0262889 (2009-10-01), Dugas et al.
patent: 2010/0080351 (2010-04-01), Hession-Kunz et al.
patent: 2010/0134794 (2010-06-01), Odegard et al.
patent: 2 271 084 (1998-05-01), None
patent: 1 191 328 (2002-03-01), None
patent: 1 607 723 (2005-12-01), None
patent: 1 936 539 (2008-06-01), None
patent: WO 2004/027404 (2004-04-01), None
patent: WO 2004/043831 (2004-05-01), None
patent: WO 2007/075922 (2007-07-01), None
Stan Piorek, “Screening Materials for RoHS Compliance with the Niton XLt Analyzer—The Portable XRF Solution for Electronics Industry,” White Paper, XP002519183, (2005).
Gregory Farnum, “Will RFID Put the ‘Auto’ into Auto ID?, ” Managing Automation, pp. 51-52, (1994).
Departmrnt of Defense, “Defense Federal Acquisition Regulation Supplement; Radio Frequency Identification,” Federal Register, vol. 70 (No. 76), p. 20726-20729, (2005).
Department of Defense, “Defense Federal Acquisition Regulation Supplement; Radio Frequency Identification; Correction,” Federal Register, vol. 70 (No. 80), p. 21729, (2005).
Scott J. Horne, “Comments of The Institute of Scrap Recycling Industries, Inc. On Proposed Amendments to the Defense Federal Acquisition Regulations Supplement to Add Policy Pertaining to Package Marking with Passive Radio Frequency Identification Tags,” The Institute of Scrap Recycling Industries, Inc. pp. 1-6, (2005).
Donna Pellerin George, “Leaving Las Vegas,” Sensors Magazine, pp. 1-4, (2004).
Texas Instruments, “Multi Standard Fully Integrated 13.56-MHz Radio Frequency Identification (RFID) Analog Front End and Data Framing Reader System,” TRF7960/61 Product Data Sheet, pp. 1-8, (2006).
Phillip F. Schewe, “All-Optical Magnetic Recording,” The American Institute of Physics Bulletin of Physics News, No. 830, (2007).
Weber Marking Systems, Inc., “Alpha RFID Smart Label Applicator,” Encoder Verifier web page, http://www.webermarking.com, (2007).
Weber Marking Systems, Inc., “RFID Printing & Encoding Solutions from Weber,” RFID Printers/Encoders web page, http://www.webermarking.com, (2007).
Thermo Scientific Niton, “XRF Rentals,” Niton XRF Analyzers Product Literature, http://www.niton.com/Rentals-and-Leasing/rentals.aspx, (2007).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Docking stand for analytical instrument does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Docking stand for analytical instrument, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Docking stand for analytical instrument will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2743436

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.