DNA microarray image analysis system

Image analysis – Applications – Biomedical applications

Reexamination Certificate

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Details

C382S156000, C382S157000, C382S159000

Reexamination Certificate

active

10853178

ABSTRACT:
In a microarray image analysis system, when one of a plurality of statuses is set for a spot of a microarray by the user, the status of a similar spot is automatically determined. In a microarray image, the user determines a status of a spot, the pixel value matrix of an image in a spot region is learned by a neural network, a vertically and horizontally symmetrical image and an image rotated about the center of the region are formed and are learned by the neural network, and the neural network formed by repeating these steps is used for automatically recognizing the status of an undecided spot.

REFERENCES:
patent: 2003/0142094 (2003-07-01), Zhang
patent: 7-306149 (1993-07-01), None
patent: 2002-189026 (2001-08-01), None
Schmidt, W. et al., “Pattern Recognition Properties of Various Feature Spaces for Higher Order Neutral Networks”, IEEE Transactions on Pattern Analysis Machin Intelligence, Aug. 1993, pp. 795-801.
Hautaniemi Sampsa et al: “A novel strategy for microarray quality control using Bayesian networks.” Bioinformatics (Oxford, England) Nov. 1, 2003, vol. 19, No. 16, Nov. 1, 2003, pp. 2031-2038, XP002403872 ISSN: 1367-4803.
Bicego, M. et al. “A supervised data-driven approach for microarray spot quality classification”, Springer-Verlag London Limited, Jun. 11, 2005, pp. 181-187.
Schmidt, W. et al., “Pattern Recognition Properties of Various Feature Spaces for Higher Order Neutral Networks”, IEEE Transactions on Pattern Analysis Machin Intelligence, Aug. 1993, pp. 795-801.
Hautaniemi, S. et al., “A novel strategy for microarray quality control using Bayesian networks”, Bioinformatics, 2003, vol. 19 No. 16, pp. 2031-2038.
Ruosarri, S. et al. “Image Analysis for Detecting Faulty Spots from Microarray Images”, Springer-Verlag Berlin Heidelberg, 2002, pp. 259-266.
Buhler, J. et al. “Dapple: Improved Techniques for Finding Spots on DNA Microarrays”, UW CSE Technical Report UWTR, Aug. 5, 2000, pp. 1-12.

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