Distributed test pattern generation

Details Distributed test pattern generation Distributed test pattern generation

1997-01-16

1998-09-01

Canney, Vincent P.

Excavating

371 2231, G06F 1100

Patent

active

058020756

ABSTRACT:
A method and apparatus for automatically generating test patterns for a circuit design using a number of data processing elements. The present invention reduces the wall time required to generate the test patterns for the overall circuit design by partitioning the design into a number of partitions, distributing the partitions to a number of data processing elements, and generating test patterns for each partition on the corresponding data processing elements. The present invention automatically assembles the resulting local test patterns to reflect the scan structure of the overall circuit design.

REFERENCES:
patent: 4758953 (1988-07-01), Morita et al.
patent: 4831543 (1989-05-01), Mastellone
patent: 4918614 (1990-04-01), Modarres et al.
patent: 5050091 (1991-09-01), Rubin
patent: 5164908 (1992-11-01), Igarashi
patent: 5175696 (1992-12-01), Hopper et al.
patent: 5222029 (1993-06-01), Hopper et al.
patent: 5255363 (1993-10-01), Seyler
patent: 5267175 (1993-11-01), Hopper
patent: 5341309 (1994-08-01), Kawata
patent: 5349659 (1994-09-01), Do et al.
patent: 5355317 (1994-10-01), Talbott et al.
patent: 5357440 (1994-10-01), Talbott et al.
patent: 5359523 (1994-10-01), Talbott et al.
patent: 5359537 (1994-10-01), Saucier et al.
patent: 5361357 (1994-11-01), Kionka
patent: 5398195 (1995-03-01), Kim
patent: 5406497 (1995-04-01), Altheimer et al.
patent: 5416721 (1995-05-01), Nishiyama et al.
patent: 5418733 (1995-05-01), Kamijima
patent: 5418954 (1995-05-01), Petrus
patent: 5440720 (1995-08-01), Baisuck et al.
patent: 5483461 (1996-01-01), Lee et al.
patent: 5485396 (1996-01-01), Brasen et al.
patent: 5490266 (1996-02-01), Sturges
patent: 5490268 (1996-02-01), Matsunaga
patent: 5491640 (1996-02-01), Sharma et al.
patent: 5493508 (1996-02-01), Dangelo et al.

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